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{iso(1) identified-organization(3) dod(6) internet(1) private(4) enterprise(1) 2011 huaweiUtility(6) hwTest(21) hwTestCommon(1) hwTestCommonTraps(2) hwTestCommonAlarmTraps(2) hwTestCommonAlarmTrapsOIDs(0) hwTestMeltChipFaultAlarmTrap(4)}
hwTestMeltChipFaultAlarmTrap(4)
 
 

OID description



  
OID: (ASN.1 notation)
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Description:
hwTestMeltChipFaultAlarmTrap NOTIFICATION-TYPE
OBJECTS {hwFrameIndex, hwSlotIndex, hwTestMeltChipID, hwPortMeltChipStateList}
STATUS current
DESCRIPTION
"MELT chip fault trap:
1: hwFrameIndex; 2: hwSlotIndex; 3: hwTestMeltChipID; 4: hwPortMeltChipStateList.
When detecting a MELT chip fault, the system generates this trap."


Classification:
MIB object for network management

 
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Parent OID: hwTestCommonAlarmTrapsOIDs(0) First sibling OID: hwTestRingSrcFailTrap(1) Previous sibling OID: hwTestAutoClearedTrap(3) Next sibling OID: hwTestMeltChipRecoveryAlarmTrap(5) Last sibling OID: hwTestMeltChipRecoveryAlarmTrap(5)