Description:
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hwTestCommon MODULE-IDENTITY
LAST-UPDATED "201503251500Z"
ORGANIZATION "Huawei Technologies Co.,Ltd."
CONTACT-INFO
"Huawei Industrial Base
Bantian, Longgang
Shenzhen 518129
People's Republic of China
Website: http://www.huawei.com
Email: support@huawei.com"
DESCRIPTION
"This MIB is used for Metallic line test(MELT).Melt test is a
common line status test method,used to test whether the copper
twisted pair from the service board to the phone set is normal.
Common MELT operations include starting a MELT test, querying
the test result, querying the calibration data, and starting
and stopping a searching tone test."
-- Revision history
REVISION "201503251500Z"
DESCRIPTION
"V3.45, Modified the description of the leaf hwONTPotsTestItem"
REVISION "201501201200Z"
DESCRIPTION
"V3.44, Modified the values of the following leaves:
hwBoardMeltChipStateCheckDCVolUpperLimit
hwBoardMeltChipStateCheckDCVolLowerLimit"
REVISION "201412121200Z"
DESCRIPTION
"V3.43, Modified the description of the leaf hwLoopLineTestConclusion"
REVISION "201411041435Z"
DESCRIPTION
"V3.42,
1. Added enum(meltChipFaulty (11) and meltChipCheckInProcess(12)) into hwLoopLineTestStatus
2. Added hwLoopLineTestMeltChipStateTable.
Added the following leaves into hwLoopLineTestMeltChipStateTable:
hwBoardMeltChipStateCheckConfig
hwBoardMeltChipStateCheckResult
hwPortMeltChipStateList
hwBoardMeltChipStateCheckDCVolUpperLimit
hwBoardMeltChipStateCheckDCVolLowerLimit
3. Added hwMeltChipStateCheck table.
Added the following leaves into hwMeltChipStateCheck table:
hwMeltChipStateCheckConfig
hwMeltChipStateCheckTime
hwMeltChipStateCheckDCVolUpperLimit
hwMeltChipStateCheckDCVolLowerLimit
4. Added hwTestMeltChipID into hwTestCommonTrapVbOids:
5. Added the following leaves into hwTestCommonAlarmTrapsOIDs:
hwTestMeltChipFaultAlarmTrap
hwTestMeltChipRecoveryAlarmTrap
6. Added hwTestMeltChipStateCheckResultTrap into hwTestCommonGeneralTrapsOIDs"
REVISION "201406041040Z"
DESCRIPTION
"V3.41, Modified the syntax for OMSYS"
REVISION "201404091000Z"
DESCRIPTION
"V3.40, Cleared tab"
REVISION "201403161600Z"
DESCRIPTION
"V3.39, Modified the default value of the leaf hwLoopLineTestBusyProcFlag"
REVISION "201309161600Z"
DESCRIPTION
"V3.38, Added the following leaves into hwONTPotsTestOprTable:
hwONTPotsTestLoopDCAGVoltCompensativeValue
hwONTPotsTestLoopDCBGVoltCompensativeValue
hwONTPotsTestLoopDCABVoltCompensativeValue
hwONTPotsTestLoopACAGVoltCompensativeValue
hwONTPotsTestLoopACBGVoltCompensativeValue
hwONTPotsTestLoopACABVoltCompensativeValue
hwONTPotsTestLoopResistanceAGCompensativeValue
hwONTPotsTestLoopResistanceBGCompensativeValue
hwONTPotsTestLoopResistanceABCompensativeValue"
REVISION "201204150900Z"
DESCRIPTION
"V3.37, Added an enum into hwLoopLineTestStatus
Delete unnecessary en dashes"
REVISION "201203220900Z"
DESCRIPTION
"V3.36, Added the following leaves into hwLoopLineTestSysConfigPara:
hwLoopLineTestSysConfigSigCapUpperLimit
hwLoopLineTestSysConfigSigCapLowerLimit
hwLoopLineTestSysConfigSigResistance"
REVISION "201203210900Z"
DESCRIPTION
"V3.35, Modified the string length and description of
hwLoopLineTestMeltChip.
Added the following leaves into hwLoopLineTestOprTable:
hwLoopLineTestCapterminal
hwLoopLineTestCapterminalFlag.
Added the following leaves into hwLoopLineTestSysConfigPara:
hwLoopLineTestSysConfigCableFactor"
REVISION "201105051900Z"
DESCRIPTION
"V3.34, Modified the definitions of hwLoopLineTestOprTable and hwTestCommonMeltTestResultTrap.
Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestCtrLV
hwLoopLineTestCtrLVFlag
hwLoopLineTestCtrHV
hwLoopLineTestCtrHVFlag
hwLoopLineTestCtrAc
hwLoopLineTestCtrAcFlag
hwLoopLineTestRtgSer
hwLoopLineTestRtgSerFlag
hwLoopLineTestRrgSer
hwLoopLineTestRrgSerFlag
hwLoopLineTestRtrSer
hwLoopLineTestRtrSerFlag
hwLoopLineTestUtgAcAdmit
hwLoopLineTestUtgAcAdmitFlag
hwLoopLineTestUrgAcAdmit
hwLoopLineTestUrgAcAdmitFlag
hwLoopLineTestUtrAcAdmit
hwLoopLineTestUtrAcAdmitFlag
Add enums into leaf hwLoopLineTestMoreDataFlag in hwTestCommonMeltTestResultTrap."
-- Revision history
REVISION "201104300900Z"
DESCRIPTION
"V3.33, Added following leaves into hwLoopLineTestOprTable:
hwONTPotsTestLoopDCABVoltValue
hwONTPotsTestLoopACABVoltValue
hwONTPotsTestLoopAGCapacitanceValue
hwONTPotsTestLoopBGCapacitanceValue
hwONTPotsTestLoopABCapacitanceValue
Added the following trap nodes into hwTestOntPotsTestResultTrap:
hwONTPotsTestLoopDCABVoltValue
hwONTPotsTestLoopACABVoltValue
hwONTPotsTestLoopAGCapacitanceValue
hwONTPotsTestLoopBGCapacitanceValue
hwONTPotsTestLoopABCapacitanceValue
Modified the leaves's description of hwONTPotsTestOprTable:
hwONTPotsTestLoopDCAGVoltValue
hwONTPotsTestLoopDCBGVoltValue
hwONTPotsTestLoopACAGVoltValue
hwONTPotsTestLoopACBGVoltValue
hwONTPotsTestLoopResistanceAGValue
hwONTPotsTestLoopResistanceBGValue
hwONTPotsTestLoopResistanceABValue"
-- Revision history
REVISION "201103060900Z"
DESCRIPTION
"V3.32, Modified the definition of the table hwLoopLineTestOprTable.
Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestLRFlag
hwLoopLineTestDcCurrent
hwLoopLineTestAcCurrent
hwLoopLineTestConductance
hwLoopLineTestSusceptance
hwLoopLineTestAcfrequencyA
hwLoopLineTestAcfrequencyB
hwLoopLineTestRABH
hwLoopLineTestRABHFlag
hwLoopLineTestCapABH
hwLoopLineTestCapABHFlag
hwLoopLineTestGtrH
hwLoopLineTestGtrHFlag
hwLoopLineTestBtrH
hwLoopLineTestBtrHFlag
hwLoopLineTestABDcCurrent
hwLoopLineTestABDcCurrentFlag
hwLoopLineTestBADcCurrent
hwLoopLineTestBADcCurrentFlag
hwLoopLineTestABAcCurrent
hwLoopLineTestABAcCurrentFlag
hwLoopLineTestBAAcCurrent
hwLoopLineTestBAAcCurrentFlag
hwLoopLineTestCSfrequencyForTest
hwLoopLineTestCSfrequencyForTestFlag
hwLoopLineTestImpedanceForTest
hwLoopLineTestImpedanceForTestFlag
hwLoopLineTestMaxVForSignature
hwLoopLineTestMaxVForSignatureFlag
hwLoopLineTestAGMaxVForTest
hwLoopLineTestAGMaxVForTestFlag
hwLoopLineTestAGMinVForTest
hwLoopLineTestAGMinVForTestFlag
hwLoopLineBGMaxVForTest
hwLoopLineTestBGMaxVForTestFlag
hwLoopLineTestBGMinVForTest
hwLoopLineTestBGMinVForTestFlag
hwLoopLineTestABMaxVForTest
hwLoopLineTestABMaxVForTestFlag
hwLoopLineTestABMinVForTest
hwLoopLineTestABMinVForTestFlag
hwLoopLineTestAGMaxCForTest
hwLoopLineTestAGMaxCForTestFlag
hwLoopLineTestAGMinCForTest
hwLoopLineTestAGMinCForTestFlag
hwLoopLineTestBGMaxCForTest
hwLoopLineTestBGMaxCForTestFlag
hwLoopLineTestBGMinCForTest
hwLoopLineTestBGMinCForTestFlag
hwLoopLineTestABMaxCForTest
hwLoopLineTestABMaxCForTestFlag
hwLoopLineTestABMaxNegCForTest
hwLoopLineTestMaxNegCForTestFlag
hwLoopLineTestMaxNegCForTestFlag
hwLoopLineTestLineALength
hwLoopLineTestLineBLength
hwLoopLineTestTermimalConcusion
hwLoopLineTestMoreDataFlag
Add an enum notsupport(3) into following leaves:
hwLoopLineTestACAGFlag
hwLoopLineTestACBGFlag
hwLoopLineTestACABFlag
hwLoopLineTestDCAGFlag
hwLoopLineTestDCBGFlag
hwLoopLineTestDCABFlag
hwLoopLineTestRAGFlag
hwLoopLineTestRBGFlag
hwLoopLineTestRABFlag
hwLoopLineTestRABPoleFlag
hwLoopLineTestRABResPoleFlag
hwLoopLineTestCapAGFlag
hwLoopLineTestCapBGFlag
hwLoopLineTestCapABFlag
hwLoopLineTestRbattipFlag
hwLoopLineTestRbatringFlag
hwLoopLineTestRringFlag
hwLoopLineTestCsigFlag
hwLoopLineTestUtgAcFreqFlag
hwLoopLineTestUrgAcFreqFlag
hwLoopLineTestUtrAcFreqFlag
hwLoopLineTestItipAcFlag
hwLoopLineTestIringAcFlag
hwLoopLineTestItipDcFlag
hwLoopLineTestIringDcFlag
hwLoopLineTestGtgFlag
hwLoopLineTestBtgFlag
hwLoopLineTestGrgFlag
hwLoopLineTestBrgFlag
hwLoopLineTestGtrFlag
hwLoopLineTestBtrFlag
Add enums into leave hwLoopLineTestConclusion in hwLoopLineTestOprTable:
abRFaultId(91)
aRFaultId(92)
bRFaultId(93)
abLeakId(94)
aLeakId(95)
bLeakId(96)
abFvacLevelH(97)
aFvacLevelH(98)
bFvacLevelH(99)
abFvacLevelI(100)
aFvacLevelI(101)
bFvacLevelI(102)
abFvacLevelO(103)
aFvacLevelO(104)
bFvacLevelO(105)
abFvDcLevelH(106)
aFvDcLevelH(107)
bFvDcLevelH(108)
abFvDcLevelI(109)
aFvDcLevelI(110)
bFvDcLevelI(111)
abFvDcLevelO(112)
aFvDcLevelO(113)
bFvDcLevelO(114)
fesIdPPA(115)
fesIdPPAInv(116)
fesId2PPA(117)
fesId2PPAInv(118)
etsiXdslSignature(119)
fetIdEr(120)
abreak(121)
bbreak(122)
abreakInMDF(123)
bbreakInMDF(124)
abreakOutMDF(125)
bbreakOutMDF(126)
Added the following trap nodes into hwLoopLineTestTrap:
hwLoopLineTestMSocket
hwLoopLineTestPPAResult
hwLoopLineTestMoreDataFlag
Added following leaves into hwSearchingToneOprTable:
hwSearchingToneBusyProcFlag"
-- Revision history
REVISION "201012240900Z"
DESCRIPTION
"V3.31, Modify the value of
hwONTPotsTestSubscriberLineTestResult."
REVISION "201012220900Z"
DESCRIPTION
"V3.30, Modified the description of MIB."
REVISION "201011230900Z"
DESCRIPTION
"V3.29, Added hwONTPotsTestSubscriberLineTestResult into
hwONTPotsTestOprTable.
Modified the definition of the trap node
hwTestOntPotsTestResultTrap."
REVISION "201011090900Z"
DESCRIPTION
"V3.28, Added hwWettingCurrentOprTable.
Added following leaves into hwWettingCurrentOprTable:
hwWettingCurrentOprStatus
hwWettingCurrentOprWorkingVoltage
hwWettingCurrentOprMaximumVoltage
hwWettingCurrentOprSlope.
Modified the description of MIB."
REVISION "201010100900Z"
DESCRIPTION
"V3.27, Modified the description of MIB."
REVISION "201008110900Z"
DESCRIPTION
"V3.26, Modified the definition of the trap node,include: hwLoopLineTestTrap.
Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestIfIndex
hwLoopLineTestRequestID."
REVISION "201008100900Z"
DESCRIPTION
"V3.25, Delete hwONTPotsTestMLTResult note of the trap node: hwTestOntPotsTestResultTrap.
Modify the leaves's description of the table hwONTPotsTestOprTable.
Added an enum inverseexist(3) in leaf hwLoopLineTestPPAResult."
REVISION "201007290900Z"
DESCRIPTION
"V3.24, Added hwPortTestingListOprTable.
Modified the description of MIB."
REVISION "201007070900Z"
DESCRIPTION
"V3.23, Modified the name of hwTestCommonStartupMeltTestResultTrap to hwTestCommonMeltTestFaileTrap.
Modified the description of MIB.
Added hwTestCommonRequestID, ifIndex, hwONTPotsTestONTIndex, hwONTPotsTestONTPstnPortIndex, and hwONTPotsTestItem to hwTestOntPotsTestResultTrap.
Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestPPAResultFlag
hwLoopLineTestUtgAcFreqFlag
hwLoopLineTestUrgAcFreqFlag
hwLoopLineTestUtrAcFreqFlag
hwLoopLineTestItipAcFlag
hwLoopLineTestIringAcFlag
hwLoopLineTestItipDcFlag
hwLoopLineTestIringDcFlag
hwLoopLineTestGtgFlag
hwLoopLineTestBtgFlag
hwLoopLineTestGrgFlag
hwLoopLineTestBrgFlag
hwLoopLineTestGtrFlag
hwLoopLineTestBtrFlag
hwLoopLineTestSIGNFlag
hwLoopLineTestACFEMFlag
hwLoopLineTestDCFEMFlag
hwLoopLineTestONHKFlag
hwLoopLineTestOPENFlag
hwLoopLineTestSHORTFlag
hwLoopLineTestROHFlag
hwLoopLineTestUtgDcUpFlag
hwLoopLineTestUtgDcDownFlag
hwLoopLineTestUrgDcUpFlag
hwLoopLineTestUrgDcDownFlag
hwLoopLineTestUtrPosFlag
hwLoopLineTestUtrNegFlag
hwLoopLineTestItgDcUpFlag
hwLoopLineTestItgDcDownFlag
hwLoopLineTestIrgDcUpFlag
hwLoopLineTestIrgDcDownFlag
hwLoopLineTestItrPosFlag
hwLoopLineTestItrNegFlag
hwLoopLineTestRingerFlag.
Modified the name of hwSearchingToneTimeout to hwSearchingToneDurationTime.
Modified the range of hwSearchingToneDurationTime to 1-54000.
Modified the default value of hwSearchingToneDurationTime to 9000.
Modified the unit of hwSearchingToneDurationTime to 0.1s.
Added hwSearchingToneRemainingTime to hwSearchingToneOprTable."
REVISION "201006220900Z"
DESCRIPTION
"V3.22, Modified the description of hwLoopLineTestRinger."
REVISION "201004200900Z"
DESCRIPTION
"V3.21, Modified the size list of hwLoopLineTestMeltFactory."
REVISION "201004150900Z"
DESCRIPTION
"V3.20, Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestSNMPRab
hwLoopLineTestSNMPRabFlag
hwLoopLineTestSNMPRba
hwLoopLineTestSNMPRbaFlag."
REVISION "201004010900Z"
DESCRIPTION
"V3.19, Modified the syntax error."
REVISION "201003090900Z"
DESCRIPTION
"V3.18, Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestRABPole
hwLoopLineTestACAGFlag
hwLoopLineTestACBGFlag
hwLoopLineTestACABFlag
hwLoopLineTestDCAGFlag
hwLoopLineTestDCBGFlag
hwLoopLineTestDCABFlag
hwLoopLineTestRAGFlag
hwLoopLineTestRBGFlag
hwLoopLineTestRABFlag
hwLoopLineTestItrPosFlag
hwLoopLineTestItrNegFlag
hwLoopLineTestCapAGFlag
hwLoopLineTestCapBGFlag
hwLoopLineTestCapABFlag
hwLoopLineTestRbattipFlag
hwLoopLineTestRbatringFlag
hwLoopLineTestRringFlag
hwLoopLineTestCsigFlag
hwLoopLineTestPPAResFlag
hwLoopLineTestVzenerFlag
hwLoopLineTestRzenerFlag."
REVISION "201002080900Z"
DESCRIPTION
"V3.17, modified the definitions of hwTestCommonMeltTestResultTrap and hwTestCommonStartupMeltTestResultTrap."
REVISION "201001210900Z"
DESCRIPTION
"V3.16, Added hwONTPotsTestOprTable for ONT POTS test.
Added the definition of the trap node:hwTestOntPotsTestResultTrap,include:
hwONTPotsTestMLTResult,
hwONTPotsTestHazardousVoltResult,
hwONTPotsTestEMFResult,
hwONTPotsTestResistacneResult,
hwONTPotsTestOffHookResult,
hwONTPotsTestRingerResult,
hwONTPotsTestNT1DCSignalResult,
hwONTPotsTestSelfTestResult,
hwONTPotsTestDrawDialToneResult,
hwONTPotsTestBreakDialToneResult,
hwONTPotsTestQuietEnergyResult,
hwONTPotsTestDialToneEnergyResult,
hwONTPotsTestLoopDCAGVoltResult,
hwONTPotsTestLoopDCBGVoltResult,
hwONTPotsTestLoopACAGVoltResult,
hwONTPotsTestLoopACBGVoltResult,
hwONTPotsTestLoopResistanceAGResult,
hwONTPotsTestLoopResistanceBGResult,
hwONTPotsTestLoopResistanceABResult,
hwONTPotsTestLoopRingerLoadTestResult,
hwONTPotsTestDrawDialToneTimeValue,
hwONTPotsTestBreakDialToneTimeValue,
hwONTPotsTestQuietEnergyValue,
hwONTPotsTestDialToneEnergyValue,
hwONTPotsTestLoopDCAGVoltValue,
hwONTPotsTestLoopDCBGVoltValue,
hwONTPotsTestLoopACAGVoltValue,
hwONTPotsTestLoopACBGVoltValue,
hwONTPotsTestLoopResistanceAGValue,
hwONTPotsTestLoopResistanceBGValue,
hwONTPotsTestLoopResistanceABValue,
hwONTPotsTestLoopRingerLoadTestValue."
REVISION "201001120900Z"
DESCRIPTION
"V3.15, Added definitions of hwTestCommonMeltTestResultTrap and hwTestCommonStartupMeltTestResultTrap."
REVISION "200912130900Z"
DESCRIPTION
"V3.14, Added hwLoopLineTestMeltVerTable for getting MELT chipset information.
Added hwLoopLineTestCalibrationTable for getting calibraton of MELT.
Added hwLoopLineTestOprMeasuredFreq for setting MELT with aggregate frequency.
Added hwSearchingToneTimeOut for setting timeout value of searchingtone.
Added hwLoopLineTestSysConfigPara for reverse polarity of A wire and B wire.
Added hwLoopLineTestSysConfigConvertAB in hwLoopLineTestSysConfigPara for setting MELT parameters."
REVISION "200912070900Z"
DESCRIPTION
"V3.13, Added following leaves into hwLoopLineTestOprTable:
hwLoopLineTestBtssPowerProcFlag
hwLoopLineTestImpedance
hwLoopLineTestImpedanceAB
hwLoopLineTestImpedanceBA
hwLoopLineTestImpedanceAG
hwLoopLineTestImpedanceBG
hwLoopLineTestCurrent
hwLoopLineTestACCurrentAG
hwLoopLineTestACCurrentBG
hwLoopLineTestACCurrentAB
hwLoopLineTestDCCurrentAG
hwLoopLineTestDCCurrentBG
hwLoopLineTestDCCurrentAB
hwLoopLineTestLoopCurrent
hwLoopLineTestLC
hwLoopLineTestNoise
hwLoopLineTestN
hwLoopLineTestPPA
hwLoopLineTestPPAResult
hwLoopLineTestDeferredTime
hwLoopLineTestTimeoutProc
hwLoopLineTestReverse
hwLoopLineTestUtgAcFreq
hwLoopLineTestUrgAcFreq
hwLoopLineTestUtrAcFreq
hwLoopLineTestItipAc
hwLoopLineTestIringAc
hwLoopLineTestItipDc
hwLoopLineTestIringDc
hwLoopLineTestRbattip
hwLoopLineTestRbatring
hwLoopLineTestRring
hwLoopLineTestCsig
hwLoopLineTestVzener
hwLoopLineTestRzener
hwLoopLineTestGtg
hwLoopLineTestBtg
hwLoopLineTestGrg
hwLoopLineTestBrg
hwLoopLineTestGtr
hwLoopLineTestBtr
hwLoopLineTestSIGN
hwLoopLineTestACFEM
hwLoopLineTestDCFEM
hwLoopLineTestONHK
hwLoopLineTestOPEN
hwLoopLineTestSHORT
hwLoopLineTestROH
hwLoopLineTestUtgDcUp
hwLoopLineTestUtgDcDown
hwLoopLineTestUrgDcUp
hwLoopLineTestUrgDcDown
hwLoopLineTestUtrPos
hwLoopLineTestUtrNeg
hwLoopLineTestItgDcUp
hwLoopLineTestItgDcDown
hwLoopLineTestIrgDcUp
hwLoopLineTestIrgDcDown
hwLoopLineTestItrPos
hwLoopLineTestItrNeg
hwLoopLineTestRinger
hwLoopLineTestPPARes
hwLoopLineTestStartTime
hwLoopLineTestEndTime.
Added hwMeterTestBusyFlag to hwMeterTestOprTable.
Added hwMeterTestBusyFlag to hwMeterTestOprTable.
Added hwTestBoardDiagnoseTestCapacitance to hwTestBoardDiagnoseTestOprTable.
Added hwSearchingToneOprTable."
REVISION "200304280900Z"
DESCRIPTION
"V3.00, Removed Chinese description."
REVISION "200303080900Z"
DESCRIPTION
"V2.00, Corrected the SYNTAX."
REVISION "200301280900Z"
DESCRIPTION
"V1.00, initial version."
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