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Action itemiso(1) Action itemidentified-organization(3) Action itemdod(6) Action iteminternet(1) Action itemprivate(4) Action itementerprise(1) Action item2011 Action itemhuaweiUtility(6) Action itemhwTest(21) Action itemhwTestCommon(1) Action itemhwTestCommonMib(1) Action itemhwTestCommonMIBObjects(1)   Navigating the OID tree
hwTestGroupOprTable(1)
child OID: Child OID separator hwTestGroupOprEntry(1) Child OID separator
 
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OID description

    
OID: (ASN.1 notation)
(dot notation)
(OID-IRI notation)

Description:
hwTestGroupOprTable OBJECT-TYPE
SYNTAX SEQUENCE OF HwTestGroupOprEntry
MAX-ACCESS not-accessible
STATUS current
DESCRIPTION
"Table of the test group:
It provides the number of the test group to which a shelf of the device corresponds.
It is uniquely identified by the number of the test group. Multiple shelves can share
a test board.
A test group corresponds to a test board. The number of a test group is the same as
the number of the shelf that houses the test board to which the test group corresponds.
The index of this table is hwTestGroupNo."

 
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Tree display Parent OID: hwTestCommonMIBObjects(1) First child OID: hwTestGroupOprEntry(1) Next sibling OID: hwLoopLineTestOprTable(2) Last sibling OID: hwMeltChipStateCheck(14)
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