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Action itemiso(1) Action itemidentified-organization(3) Action itemdod(6) Action iteminternet(1) Action itemprivate(4) Action itementerprise(1) Action item2011 Action itemhuaweiUtility(6) Action itemhwTest(21)

hwBTest(3)


[other identifier: hwBtest]
child OIDs: Child OID separator hwBTestMib(1) Child OID separator hwBTestTraps(2) Child OID separator

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Description:
hwBTest MODULE-IDENTITY
LAST-UPDATED "201201090000Z"
ORGANIZATION "Huawei Technologies Co.,Ltd."
CONTACT-INFO
"Huawei Industrial Base
Bantian, Longgang
Shenzhen 518129
People's Republic of China
Website: http://www.huawei.com
Email: support@huawei.com"
DESCRIPTION
"This MIB is used for defining Huawei's BTEST MIB objects, which is used for Broad test."
REVISION "201201090000Z"
DESCRIPTION
"V3.14, modify the description of the leaf hwBTSSAdslSeltTestParamUnCalibLineScale, hwBTSSAdslSeltTestParamUnCalibEchoRespReal, hwBTSSAdslSeltTestParamUnCalibEchoRespImg, hwBTSSAdslSeltTestParamCalibEchoRespReal, hwBTSSAdslSeltTestParamCalibEchoRespImg, hwBTSSAdslSeltTestParamVarUerC, hwBTSSAdslSeltTestParamQSPsdValue, hwBTSSAdslSeltTestParamUpShnCap, hwBTSSAdslSeltTestParamAttnAt180KHZ, hwBTSSAdslSeltTestParamAttnAt300KHZ, hwBTSSAdslSeltTestParamUerMmdC, hwBTSSAdslSeltTestParamQlnMmdC."
REVISION "201105040000Z"
DESCRIPTION
"V3.13, add leaf node hwBTSSAdslSeltTestParamCalcEnable of hwBTSSAdslSeltTestTable for setting selt test calculation switch.
Add hwBTSSAdslSeltCalibrationTable for describing calibration data of self test."
REVISION "201102220000Z"
DESCRIPTION
"V3.12, changes in this revision:
modify the description of the leaf hwBTSSTestedPortOperMode,hwBTSSAdslSeltTestParamUmeC, hwBTSSAdslSeltTestParamCalibLineScale,hwBTSSAdslSeltTest​ParamQmeC, hwBTSSAdslSeltTestParamUnCalibLineScale,hwBTSSTestedPortOper​Mode."
REVISION "201102129000Z"
DESCRIPTION
"V3.11, changes in this revision:
Add value resumeport(5) for hwBTSSTestedPortOperType."
REVISION "201010290000Z"
DESCRIPTION
"V3.10, changes in this revision:
Add value -1(invalid) for hwBTSSAdslSeltLevel and modify the description."
REVISION "201009290000Z"
DESCRIPTION
"V3.09, changes in this revision:
Add leaf node for new standard, include:
hwBTSSAdslSeltTestParamVarUerC
hwBTSSAdslSeltTestParamUerMmdC
hwBTSSAdslSeltTestParamQlnMmdC
hwBTSSAdslSeltTestParamUmeC
hwBTSSAdslSeltTestParamQmeC
hwBTSSAdslSeltTestParamUerStatus
hwBTSSAdslSeltTestParamQlnStatus
Modify the range of leaf node, include:
hwBTSSAdslSeltTestParamUnCalibLineScale
hwBTSSAdslSeltTestParamUnCalibEchoRespReal
hwBTSSAdslSeltTestParamUnCalibEchoRespImg
hwBTSSAdslSeltTestParamCalibLineScale
hwBTSSAdslSeltTestParamCalibEchoRespReal
hwBTSSAdslSeltTestParamCalibEchoRespImg
hwBTSSAdslSeltTestParamQSPsdValue"
REVISION "201009270900Z"
DESCRIPTION
"V3.08, changes in this revision:
modify the description of the hwBTSSCaptureTrap."
REVISION "201007120900Z"
DESCRIPTION
"V3.07, changes in this revision:
Add value -1(invalid) for hwBTSSTestedPortOperType and six enumerate values for hwBTSSTestedPortOperMode to support get operation."
REVISION "201006220900Z"
DESCRIPTION
"V3.06, changes in this revision:
Modify chinese character."
REVISION "201003220000Z"
DESCRIPTION
"V3.05, changes in this revision:
Add leaf node hwBTSSAdslSeltTestOperType of hwBTSSAdslSeltTestTable for setting or obtaining self test operation type.
Add leaf node hwBTSSAdslSeltTestParamLoopTermin of hwBTSSAdslSeltTestTable for obtaining selt test parameter Loop Termination.
Add leaf node hwBTSSAdslSeltTestParamLoopGauge of hwBTSSAdslSeltTestTable for setting or obtaining self test parameter Loop Gauge.
Add leaf node hwBTSSAdslDeltTestOperType of hwBTSSAdslDeltTestTable for setting or obtaining self test operation type.
Modify MAX-ACCESS, include:
hwBTSSAdslSeltTestParamAttnAt180KHZ
hwBTSSAdslSeltTestParamAttnAt300KHZ
hwBTSSAdslSeltTestParamQSPsdValue"
REVISION "201002080000Z"
DESCRIPTION
"V3.04, changes in this revision:
Delete the definition of the trap node, include:
hwBTSSCaptureTrap
hwBTSSSeltStartReplyTrap
hwBTSSSeltTestResultFirstFrameTrap
hwBTSSSeltTestResultSecondFrameTrap
hwBTSSSeltTestResultThirdFrameTrap
hwBTSSSeltTestResultFourFrameTrap
hwBTSSSeltTestResultFifthsFrameTrap
hwBTSSSeltTestResultSixthFrameTrap
hwBTSSSeltTestResultSeventhFrameTrap"
REVISION "201001120000Z"
DESCRIPTION
"V3.03, changes in this revision:
Add the definition of hwBTSSDeltResultDataTrap node."
REVISION "200906040900Z"
DESCRIPTION
"V3.02, changes in this revision:
Add the definition of SYNTAX HWBTSSxDslLineOverLap, and change the SYNTAX from INTEGER to HWBTSSxDslLineOverLap for hwBTSSxDslLineOverlapType of table hwBTSSxDslLineCfgTable
Add leaf hwBTSSCoTestBusyFlag into table hwBTSSCoTestTable OBJECT-TYPE
Add hwBTSSAuxPortCfgTable for describing aux port used for BTSS.
Add hwBTSSTestedPortOperTable for describing operation for tested port.
Add hwBTSSCqtTransTestTable for describeing CQT test by transparent command.
Add hwBTSSMultiFrameMiscOperTable for describing test relatived operation for multi-frame.
Add hwBTSSAdslSeltTestTable for describing selt test for adsl2+.
Add hwBTSSAdslDeltTestTable for describing Delt test for adsl2+.
Add hwBTSSLoopLineToneOprTable for Loop Line Tone.
Add leaf node hwBTSSTestedPortOperTrap for sending trap when tested port operation.
Add leaf node hwBTSSCqtTransTestOperResultTrap for sending trap when starting or stoping Cqt transparent test.
Add leaf node hwBTSSCqtTransTestResultTrap for sending trap when reporting the result after Cqt transparent test.
Add leaf node hwBTSSLoopLineToneOperTrap for sending trap when reporting the test result of Loop Line Tone.
Delete leafs hwBTSSxDslLineExtCrossMatrixRauModuleNo and wBTSSxDslLineExtCrossMatrixRauPortNo from table
Delete tables, include:
hwBTSSxDslLineCfgTable
hwBTSSCqtTemplateTable
hwBTSSCqtMaintainTable
hwBTSSCqtFrTestTable
hwBTSSCqtTdrTestTable
hwBTSSCqtDmtTestTable
hwBTSSCqtNseTestTable
hwBTSSCqtLbTestTable
hwBTSSCqtLcTestTable
hwBTSSCqtFrTestResultTable
hwBTSSCqtTdrTestResultTable
hwBTSSCqtDmtTestResultTable
hwBTSSCqtNseTestResultTable
hwBTSSCqtLbTestResultTable
hwBTSSCqtLcTestResultTable
Delete traps, include:
hwBTSSCqtFrTestTrap
hwBTSSCqtTdrTestTrap
hwBTSSCqtDmtTestTrap
hwBTSSCqtNseTestTrap
hwBTSSCqtLbTestTrap
hwBTSSCqtLcTestTrap
hwBTSSCqtStopFrTestTrap
hwBTSSCqtStopTdrTestTrap
hwBTSSCqtStopDmtTestTrap
hwBTSSCqtStopNseTestTrap
hwBTSSCqtStopLbTestTrap
hwBTSSCqtStopLcTestTrap"
REVISION "200308280900Z"
DESCRIPTION
"V3.00, change in this revision:
Change the style of description."
REVISION "200306280900Z"
DESCRIPTION
"V2.00, change in this revision:
Correct the SYNTAX."
REVISION "200304280900Z"
DESCRIPTION
"V1.00, initial version, by FixNet Mib Group."


Classification:
➵ MIB object for network management
➵ Module in a given formal language

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Tree display Parent OID: hwTest(21) First child OID: hwBTestMib(1) First sibling OID: hwTestCommon(1) Previous sibling OID: hwNTest(2) Separation line
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