---
oid: "1.3.6.1.4.1.74.2.14.2.5"
asn1-notation: "{iso(1) identified-organization(3) dod(6) internet(1) private(4) enterprise(1) 74 att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}"
description: "rh1SelfTestRackHealthData OBJECT-TYPE"
classification: "MIB object for network management"
last-modified: "2021-11-04"
---

## OID : `1.3.6.1.4.1.74.2.14.2.5`

```asn1
{iso(1) identified-organization(3) dod(6) internet(1) private(4) enterprise(1) 74 att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}
```

### Description

```asn1
rh1SelfTestRackHealthData OBJECT-TYPE
SYNTAX OCTET STRING
ACCESS read-only
STATUS mandatory
DESCRIPTION
"This object gives data on the health of all major rack components. The object is an octet string with a size of 103 octets broken 6 sections:
Reason for trap
Chassis failure conditions
Debugging data
Test result map
Card failure map
Diagnostic results registers
The sections are encoded as follows:
Octet Definition
Reason for trap
0 Reason for trap
0 no trap
1 non-disruptive test
2 disruptive test
3 temperature condition
4 fan failure
5 power supply failure
6 Deadman timer expired
7 Software panic occurred
8 Sanity Reset occurred
9 Configuration checksum failure
Chassis failure conditions
1 Temperature condition
0 OK
1 High
2 Fan condition
0 OK
1 Fan 1 failed
2 Fan 2 failed
3 Fan 1 and Fan 2 failed
3 Power supply condition
0 OK
1 Supply 1 failed
2 Supply 2 failed
Debugging data
4-5 Software panic counters
6-7 ID last module panic
8-9 Line number of last panic
10-13 NAU control dead man timer
14-17 Sanity reset counter
18 NVRAM configuration checksum
Test Result Map (any bit set to 1 indicates the test failed on at least one card)
The map supports a total of 32 tests of which 17 are reserved for future use
19 Disruptive Rack tests (Self Test 2)
bit
Test 1 0 SRAM R/W
Test 2 1 SRAM Address
Test 3 2 MPR Registers
Test 4 3 Security R/W
Test 5 4 NAU Memory R/W
Test 6 5 NAU Memory Address
Test 7 6 NAU IRQ
Test 8 7 NAU Self Test
20
Test 9 0 NAU Loopback
Test 10 1 NAU Registers
Test 11 2 Slot 0 EAROM
Test 12-16 3-7 Reserved for future use
Non-Disruptive Rack tests (Self Test 1)
bit
21
Test 17 0 SRAM R/W
Test 18 1 SRAM Address
Test 19 2 Flash Checksum
Test 20 3 Flash Read
Test 21 4 NAU I/O
Test 22 5 NAU Memory R/W
Test 23-24 6-7 Reserved for future use
22
Test 25-32 0-7 Reserved for future use
Card Failure Map
For each test in the Test Result map, there is are two corresponding octets in the card failure map. The octets are positionally encoded to represent the cards in the rack, if a bit is set (1) it indicates which card failed that test (more than one bit may be set). Bit 0 is the Bus Logic Unit (slot 0), and bits 1 to 15 are cards 1 to 15 respectively (note the SmartHUB XE only supports 7 cards at this time)
Octet
23, 24 Test 1 card results
25, 26 Test 2 card results
27, 28 Test 3 card results
29, 30 Test 4 card results
31, 32 Test 5 card results
33, 34 Test 6 card results
35, 36 Test 7 card results
37, 38 Test 8 card results
39, 40 Test 9 card results
41, 42 Test 10 card results
43, 33 Test 11 card results
45, 46 Test 12 card results
47, 48 Test 13 card results
49, 50 Test 14 card results
51, 52 Test 15 card results
53, 54 Test 16 card results
55, 56 Test 17 card results
57, 58 Test 18 card results
59, 60 Test 19 card results
61, 62 Test 20 card results
63, 64 Test 21 card results
65, 66 Test 22 card results
67, 68 Test 23 card results
69, 70 Test 24 card results
71, 72 Test 25 card results
73, 74 Test 26 card results
75, 76 Test 27 card results
77, 78 Test 28 card results
79, 80 Test 29 card results
81, 82 Test 30 card results
83, 84 Test 31 card results
85, 86 Test 32 card results
Diagnostic Register Results
All boards also support a diagnostic register which contains a code corresponding to the current health of that board.
(This is especially useful for non-MPR boards which don't report other diagnostics through this MIB)
Definitions for diagnostic register:
0x00 to 0xEF Vendor specific
Display as 'error code: xx'
0xF0 Power on reset value
After timeout X1 Display as 'reset failure'
0xF1 Diagnostics passed
Display as 'passed'
0xF2 General failure Major
Display as 'failed'
0xF3 General failure Minor
Display as 'failed'
0xF4 Checksum error
Display as 'checksum error'
(note: this value for a bad flash image)
0xF5 Configuration error
Display as 'configuration error'
0xF6 to 0xFD Reserved for future use
Display as 'error code: xx'
0xFE Running diagnostics, extended timeout
On timeout X2 display as 'diagnostic timeout'
0xFF Running diagnostics, standard timeout
On timeout X3 display as 'diagnostic timeout'
Octet
87 Slot 0 diagnostic register
88 Slot 1 diagnostic register
89 Slot 2 diagnostic register
90 Slot 3 diagnostic register
91 Slot 4 diagnostic register
92 Slot 5 diagnostic register
93 Slot 6 diagnostic register
94 Slot 7 diagnostic register
95 Slot 8 diagnostic register
96 Slot 9 diagnostic register
97 Slot 10 diagnostic register
98 Slot 11 diagnostic register
99 Slot 12 diagnostic register
100 Slot 13 diagnostic register
101 Slot 14 diagnostic register
102 Slot 15 diagnostic register"
```

**Classification**: MIB object for network management

### Child OIDs

No child OID

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